Title :
Abstraction and Refinement Techniques in Automated Design Debugging
Author :
Safarpour, Sean ; Veneris, Andreas
Author_Institution :
Univ. of Toronto, Toronto
Abstract :
Verification is a major bottleneck in the VLSI design flow with the tasks of error detection, error localization, and error correction consuming up to 70% of the overall design effort. This work proposes a departure from conventional debugging techniques by introducing abstraction and refinement during error localization. Under this new framework, existing debugging techniques can handle large designs with long counter-examples yet remain run time and memory efficient. Experiments on benchmark and industrial designs confirm the effectiveness of the proposed framework and encourage further development of abstraction and refinement methodologies for existing debugging techniques.
Keywords :
VLSI; electronic design automation; error correction; error detection; integrated circuit design; integrated circuit testing; VLSI design flow; abstraction technique; automated design debugging; error correction; error detection; error localization; functional verification; refinement technique; Clocks; Computer errors; Concrete; Debugging; Design engineering; Error correction; Logic design; Refining; Testing; Very large scale integration;
Conference_Titel :
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2839-2