• DocumentCode
    2554298
  • Title

    Abstraction and Refinement Techniques in Automated Design Debugging

  • Author

    Safarpour, Sean ; Veneris, Andreas

  • Author_Institution
    Univ. of Toronto, Toronto
  • fYear
    2006
  • fDate
    4-5 Dec. 2006
  • Firstpage
    88
  • Lastpage
    93
  • Abstract
    Verification is a major bottleneck in the VLSI design flow with the tasks of error detection, error localization, and error correction consuming up to 70% of the overall design effort. This work proposes a departure from conventional debugging techniques by introducing abstraction and refinement during error localization. Under this new framework, existing debugging techniques can handle large designs with long counter-examples yet remain run time and memory efficient. Experiments on benchmark and industrial designs confirm the effectiveness of the proposed framework and encourage further development of abstraction and refinement methodologies for existing debugging techniques.
  • Keywords
    VLSI; electronic design automation; error correction; error detection; integrated circuit design; integrated circuit testing; VLSI design flow; abstraction technique; automated design debugging; error correction; error detection; error localization; functional verification; refinement technique; Clocks; Computer errors; Concrete; Debugging; Design engineering; Error correction; Logic design; Refining; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Print_ISBN
    0-7695-2839-2
  • Type

    conf

  • DOI
    10.1109/MTV.2006.1
  • Filename
    4197227