• DocumentCode
    255461
  • Title

    Novel solutions for suppressing parasitic turn-on behaviour on lateral vertical JFETs

  • Author

    Velander, Erik ; Lofgren, Andreas ; Kretschmar, Karsten ; Nee, H.-P.

  • Author_Institution
    Bombardier Transp., Västerås, Sweden
  • fYear
    2014
  • fDate
    26-28 Aug. 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The SiC (LV-JFET) has several advantages as a switch component in frequency converters. One challenge, when using the component at high switching speed is the coupled unwanted turn-on of the complementary switch, called parasitic turn-on. This paper presents three different novel solutions to suppress parasitic turn-on for a module design on the gate-drive-unit level. Measurements and improvements results on two of the solutions are presented. The paper shows that the losses could be significantly decreased by active current sources and the proposed clamping solution.
  • Keywords
    junction gate field effect transistors; silicon compounds; wide band gap semiconductors; LV-JFET; SiC; active current sources; clamping solution; frequency converters; gate-drive-unit level; lateral vertical JFET; parasitic turn-on behaviour; Capacitors; Clamps; Current measurement; JFETs; Logic gates; Silicon carbide; Switches; JFET; Silicon Carbide (SiC); Voltage Source Converter (VSC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on
  • Conference_Location
    Lappeenranta
  • Type

    conf

  • DOI
    10.1109/EPE.2014.6910760
  • Filename
    6910760