DocumentCode :
255461
Title :
Novel solutions for suppressing parasitic turn-on behaviour on lateral vertical JFETs
Author :
Velander, Erik ; Lofgren, Andreas ; Kretschmar, Karsten ; Nee, H.-P.
Author_Institution :
Bombardier Transp., Västerås, Sweden
fYear :
2014
fDate :
26-28 Aug. 2014
Firstpage :
1
Lastpage :
8
Abstract :
The SiC (LV-JFET) has several advantages as a switch component in frequency converters. One challenge, when using the component at high switching speed is the coupled unwanted turn-on of the complementary switch, called parasitic turn-on. This paper presents three different novel solutions to suppress parasitic turn-on for a module design on the gate-drive-unit level. Measurements and improvements results on two of the solutions are presented. The paper shows that the losses could be significantly decreased by active current sources and the proposed clamping solution.
Keywords :
junction gate field effect transistors; silicon compounds; wide band gap semiconductors; LV-JFET; SiC; active current sources; clamping solution; frequency converters; gate-drive-unit level; lateral vertical JFET; parasitic turn-on behaviour; Capacitors; Clamps; Current measurement; JFETs; Logic gates; Silicon carbide; Switches; JFET; Silicon Carbide (SiC); Voltage Source Converter (VSC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on
Conference_Location :
Lappeenranta
Type :
conf
DOI :
10.1109/EPE.2014.6910760
Filename :
6910760
Link To Document :
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