Title :
Microwave imaging for features on metallic surface with synthetic aperture radar
Author :
Han, H.C. ; Lusk, M.T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fDate :
June 28 1993-July 2 1993
Abstract :
It is demonstrated that the difference in spatial spectra for coherent and incoherent scattering SAR (synthetic aperture radar) data can be used as a mechanism to separate the specular reflection and coherent edge diffraction from the signals due to surface scatterers. A spatial-spectral filter is thus designed to make use of this property and applied to process synthetic as well as measured SAR data. A one-dimensional surface image is constructed from the filtered SAR data with a standard matched filter.<>
Keywords :
electromagnetic wave scattering; flaw detection; matched filters; metallography; microwave imaging; radar imaging; spatial filters; surface topography; synthetic aperture radar; coherent edge diffraction; matched filter; metallic surface; microwave imaging; one-dimensional surface image; spatial-spectral filter; specular reflection; surface flaw deflection; surface scatterers; synthetic aperture radar; Acoustic scattering; Filters; Microwave imaging; Microwave theory and techniques; Polarization; Radar detection; Radar scattering; Reflection; Surface contamination; Synthetic aperture radar;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385582
