DocumentCode
2554707
Title
Rebinning of conical projection data in compton imaging
Author
Mi No Lee ; Soo-Jin Lee
Author_Institution
Dept. of Electron. Eng., Paichai Univ., Daejeon, South Korea
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
2374
Lastpage
2376
Abstract
This paper presents a rebinning method for the reconstruction from Compton scattered conical projection data. Our rebinning method converts the 3-D conical projection data set into a stack of 2-D parallel projection data set so that a variety of existing 2-D analytical reconstruction methods developed for conventional emission tomography can be directly used for Compton imaging. In our rebinning method, the following three steps are performed. (i) A cone surface is sampled with a serial of lines that pass through the apex of the cone. (ii) By using the rotating imaginary planes, which are perpendicular to the transaxial (x-y) plane and parallel to the z axis, the sampled projection lines, which are mostly perpendicular to the imaginary planes, are sorted at each rotation angle. (iii) The sorted lines, most of which are oblique in the transaxial plane, are approximated to equivalent 2-D parallel projections in the transaxial plane using the Fourier rebinning (FORE) technique. Since our method is very fast, it can be useful for rapidly reconstructing Compton scattered data using fast analytical reconstruction methods.
Keywords
Compton effect; medical image processing; single photon emission computed tomography; 2D analytical reconstruction methods; 2D parallel projection data set; 3D conical projection data set; Compton imaging; Compton scattered conical projection data; Compton scattered data; Conical projection data; Fourier rebinning technique; cone surface; conventional emission tomography; fast analytical reconstruction method; image reconstruction; rebinning method; rotating imaginary plane; rotation angle; transaxial plane;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551540
Filename
6551540
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