• DocumentCode
    2554746
  • Title

    EM-based modeling of Cascode FETs suitable for MMIC design

  • Author

    Resca, Davide ; Lonac, Julio A. ; Cignani, Rafael ; Raffo, Antonio ; Santarelli, Alberto ; Vannini, Giorgio ; Filicori, Fabio

  • Author_Institution
    Dept. of Electron. Comput. Sci. & Syst., Univ. of Bologna, Bologna, Italy
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    981
  • Lastpage
    984
  • Abstract
    Cascode FETs are widely used in the design of MMICs, owing to their almost unilateral behavior. An accurate model of the cell is indeed necessary in order to achieve good circuit performance estimations. In the literature, the Cascode cell models are usually obtained on the basis of measurements of the entire structure or by a preliminary characterization of the common source elementary cell. However, the different influence of the parasitic network between common source and common gate topologies are not taken into account in the latter case. In this paper, a distributed approach based on EM simulations is adopted for the modeling of the parasitic network of the Cascode cell. The proposed procedure leads to a well conditioned characterization of the intrinsic devices, which can be used for the modeling of both the common source and the common gate transistors. Wide experimental validation is provided in the paper.
  • Keywords
    MMIC; field effect transistors; EM-based modeling; MMIC design; cascode FET; cascode cell models; common source elementary cell; field effect transistors; monolithic microwave integrated circuits; Character generation; Distributed amplifiers; Electromagnetic measurements; FETs; Field effect MMICs; Foundries; Microwave devices; Phase measurement; Predictive models; Scattering parameters; Electromagnetic analysis; MMICs; Microwave FETs; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165863
  • Filename
    5165863