• DocumentCode
    2554763
  • Title

    Analysis of UHV prepared CIS films with surface and bulk sensitive methods

  • Author

    Dimmler, B. ; Grunwald, F. ; Schmid, D. ; Schock, H.W.

  • Author_Institution
    Inst. Fuer Physikalische Elektronik, Stuttgart Univ., Germany
  • fYear
    1991
  • fDate
    7-11 Oct 1991
  • Firstpage
    1088
  • Abstract
    CuInSe2 was prepared in UHV using conventional bilayer recipes and a novel monolayer approach. The thin film layers were analyzed with surface and bulk sensitive methods. Two different states of the CuInSe2 surface according to XPS were found: a Cu-rich state containing Cu2-xSe, and an In-rich state with a Cu/In ratio of 1/3. Direct comparison of surface and bulk compositional data with electrical solar cell device parameters proves that the In-rich surface is essential for reasonable device performance. First results with monolayer-based devices which achieved efficiencies up to 11.5% demonstrate the ability of the simplified process of substitute the bilayer process that is difficult in process control
  • Keywords
    X-ray photoelectron spectra; copper compounds; indium compounds; semiconductor device testing; semiconductor thin films; solar cells; ternary semiconductors; UHV; XPS; bulk sensitive methods; monolayer; performance; semiconductor thin films; solar cell; surface sensitive methods; testing; Computational Intelligence Society; Magnetic analysis; Photovoltaic cells; Scanning electron microscopy; Spectroscopy; Substrates; Surface contamination; Surface morphology; Surface treatment; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-87942-636-5
  • Type

    conf

  • DOI
    10.1109/PVSC.1991.169379
  • Filename
    169379