DocumentCode :
2554763
Title :
Analysis of UHV prepared CIS films with surface and bulk sensitive methods
Author :
Dimmler, B. ; Grunwald, F. ; Schmid, D. ; Schock, H.W.
Author_Institution :
Inst. Fuer Physikalische Elektronik, Stuttgart Univ., Germany
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
1088
Abstract :
CuInSe2 was prepared in UHV using conventional bilayer recipes and a novel monolayer approach. The thin film layers were analyzed with surface and bulk sensitive methods. Two different states of the CuInSe2 surface according to XPS were found: a Cu-rich state containing Cu2-xSe, and an In-rich state with a Cu/In ratio of 1/3. Direct comparison of surface and bulk compositional data with electrical solar cell device parameters proves that the In-rich surface is essential for reasonable device performance. First results with monolayer-based devices which achieved efficiencies up to 11.5% demonstrate the ability of the simplified process of substitute the bilayer process that is difficult in process control
Keywords :
X-ray photoelectron spectra; copper compounds; indium compounds; semiconductor device testing; semiconductor thin films; solar cells; ternary semiconductors; UHV; XPS; bulk sensitive methods; monolayer; performance; semiconductor thin films; solar cell; surface sensitive methods; testing; Computational Intelligence Society; Magnetic analysis; Photovoltaic cells; Scanning electron microscopy; Spectroscopy; Substrates; Surface contamination; Surface morphology; Surface treatment; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169379
Filename :
169379
Link To Document :
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