DocumentCode :
2554798
Title :
Distortion and regulation characterization of a Mapham inverter
Author :
Sundberg, Richard C. ; Brush, Andrew S. ; Button, Robert M. ; Patterson, Alexander G.
Author_Institution :
Div. of Gen. Dynamics Space Syst., San Diego, CA, USA
fYear :
1989
fDate :
6-11 Aug 1989
Firstpage :
597
Abstract :
Output-voltage total harmonic distortion (THD) of a 20 kHz, 6 kVA Mapham resonant inverter is characterized as a function of its switching-to-resonant frequency ratio, fs/f r, using the EASY5 Engineering Analysis System. EASY5 circuit simulation results are compared with hardware test results to verify the accuracy of the simulations. The effects of load on the THD versus f s/fr is investigated for resistive, leading, and lagging power factor load impedances. The effect of the series output capacitor on the Mapham inverter output-voltage distortion and inherent load regulation is characterized under loads of various power factors and magnitudes. An optimum series capacitor value which improves the inherent load regulation to better than 3% is identified. A fault protection and current limiting method which allows the Mapham inverter to operate into a short-circuit, even when the inverter resonant circuit becomes overdamped, is discussed
Keywords :
aerospace computing; harmonics; invertors; power system analysis computing; software packages; space vehicle power plants; EASY5 Engineering Analysis System; Mapham inverter; current limiting; fault protection; load regulation; power factor load impedances; power system analysis computing; regulation; resonant inverter; series capacitor; software packages; space power; total harmonic distortion; Capacitors; Circuit simulation; Circuit testing; Frequency; Hardware; Harmonic analysis; Reactive power; Resonant inverters; Systems engineering and theory; Total harmonic distortion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Engineering Conference, 1989. IECEC-89., Proceedings of the 24th Intersociety
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IECEC.1989.74527
Filename :
74527
Link To Document :
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