Title : 
Transmission through a simple frequency selective surface (FSS) with random manufacturing errors
         
        
            Author : 
Skinner, J.P. ; Chavez, E.V.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., US Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
         
        
        
            fDate : 
June 28 1993-July 2 1993
         
        
        
            Abstract : 
A single thin conducting plane with an array of thin linear slots in free space is investigated. Using a finite-by-infinite array analysis, random errors are introduced in the slot geometries along the finite direction, while perfect periodicity is maintained in the infinite direction, allowing Floquet´s theorem to be used. Fields transmitted from an incident plane wave are examined in the principal plane, normal to the infinite axis. A study is made by varying the standard deviation of the geometric errors, to determine manufacturing tolerance requirements for maintaining peak transmission levels and for keeping sidelobes down.<>
         
        
            Keywords : 
antenna radiation patterns; electromagnetic wave transmission; error statistics; frequency selective surfaces; slot antenna arrays; statistical analysis; tolerance analysis; Floquet´s theorem; array of thin linear slots; frequency selective surface; manufacturing tolerance requirements; peak transmission levels; periodicity; random manufacturing errors; sidelobes; standard deviation; thin conducting plane; Computer aided manufacturing; Computer errors; Frequency selective surfaces; Geometry; Magnetic analysis; Magnetic confinement; Military computing; Random variables; Space technology; Testing;
         
        
        
        
            Conference_Titel : 
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
         
        
            Conference_Location : 
Ann Arbor, MI, USA
         
        
            Print_ISBN : 
0-7803-1246-5
         
        
        
            DOI : 
10.1109/APS.1993.385590