Title :
Repeatability of mode-stirred chamber measurements
Author :
Hatfield, Michael O. ; Bean, John L. ; Freyer, Gustav J. ; Johnson, D. Mark
Author_Institution :
Naval Surface Warfare Center, Dahlgren, VA, USA
Abstract :
The paper reports on data which demonstrate the repeatability of electromagnetic tests in mode stirred chambers. It compares the data to results obtained using anechoic chambers and discusses various factors which influence test repeatability. Data on system susceptibility and shielding effectiveness testing are presented
Keywords :
electromagnetic compatibility; electromagnetic shielding; electronic equipment testing; test facilities; electromagnetic tests; mode-stirred chamber measurements; shielding effectiveness testing; system susceptibility; test repeatability; Anechoic chambers; Electromagnetic measurements; Electromagnetic shielding; Frequency; Impedance measurement; Instruments; NIST; System testing; Tuners; Wheels;
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
DOI :
10.1109/ISEMC.1994.385600
