DocumentCode
2555025
Title
Investigation of continuous wave immunity test conditions for telecommunication equipment
Author
Kanno, Shin ; Takemoto, Fusaji ; Rikiishi, Satoru ; Kuwabara, Nobou
Author_Institution
NTT Telecommun. Networks Labs., Tokyo, Japan
fYear
1994
fDate
22-26 Aug 1994
Firstpage
479
Lastpage
484
Abstract
The relation between continuous wave immunity test conditions and failure results of equipment under test is discussed. The difference between the radiated immunity test and the conductive immunity test, and the use of the impress durations and sweep rates to detect failure are investigated. As a results, it is clarified that the results of the radiated immunity test are different from that of the conducted immunity test
Keywords
electromagnetic compatibility; printed circuit testing; radiofrequency interference; telecommunication equipment testing; 26 to 80 MHz; conductive immunity test,; continuous wave immunity test conditions; equipment under test; failure results; impress durations; radiated immunity test; sweep rates; telecommunication equipment; Cables; Central Processing Unit; Communication system control; IEC standards; Immunity testing; Interference; Laboratories; Printed circuits; Radio frequency; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-1398-4
Type
conf
DOI
10.1109/ISEMC.1994.385601
Filename
385601
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