Title :
A roadmap for NASA´s radiation effects research in emerging microelectronics and photonics
Author :
LaBel, Kenneth A. ; Barnes, Charles E. ; Marshall, Cheryl J. ; Marshall, C.J. ; Johnston, Allan H. ; Reed, Robert A. ; Barth, Janet L. ; Seidleck, Christina M. ; Kayali, Sammy A. ; Bryan, Martha V O
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
The Electronics Radiation Characterization (ERC) project of the NASA Electronic Parts and Packaging (NEPP) Program is responsible for the radiation effects research on microelectronics and photonics for NASA. In this presentation, we present our roadmap for providing aid to NASA flight projects, technology developers, and the aerospace community
Keywords :
radiation hardening (electronics); space vehicle electronics; technological forecasting; NASA electronics radiation characterization project; core flight customer support; data dissemination; enabling parameter reductions; microelectronics; photonics; radiation effects research; radiation tolerance roadmap; single event upsets; technology evaluation; Aerospace electronics; Aircraft; Hazards; Microelectronics; NASA; Photonics; Radiation effects; Space shuttles; Space technology; Space vehicles;
Conference_Titel :
Aerospace Conference Proceedings, 2000 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-5846-5
DOI :
10.1109/AERO.2000.878527
