DocumentCode
2555333
Title
Carrier velocity in carbon nano tube field effect transistor
Author
Ahmadi, Mohammad Taghi ; Saad, Ismail ; Karamdel, Javad ; Ismail, Razali ; Arora, Vijay K.
Author_Institution
Fac. of Electr. Eng., Univ. Teknol. Malaysia, Skudai
fYear
2008
fDate
25-27 Nov. 2008
Firstpage
519
Lastpage
523
Abstract
The fact that there are no dangling bond states at the surface of CNT allows for a wide choice of gate insulators. There fore the CNT are being considered as viable candidates for high-speed applications. The mobility and saturation velocity are the two important parameters that control the charge transport in a conducting MOSFET channel. It is shown that the high mobility does not always lead to higher carrier velocity. The ultimate drift velocity in carbon nanotube due to the high electric-field streaming are based on the asymmetrical distribution function that converts randomness in zero-field to streamlined one in a very high electric field. The limitation drift velocity is found to be appropriate thermal velocity for non-degenerate regime, increasing with the temperature, but independent of carrier concentration. However, the limitation drift velocity is the Fermi velocity for degenerate regime increasing with carrier concentration but independent of the temperature.
Keywords
MOSFET; carbon nanotubes; carrier mobility; field effect transistors; Fermi velocity; MOSFET channel; asymmetrical distribution function; carbon nanotube; carrier velocity; charge transport; electric-field streaming; field effect transistor; Bonding; Carbon nanotubes; Electron mobility; Equations; FETs; Java; Nanoelectronics; Particle scattering; Silicon compounds; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
Conference_Location
Johor Bahru
Print_ISBN
978-1-4244-3873-0
Electronic_ISBN
978-1-4244-2561-7
Type
conf
DOI
10.1109/SMELEC.2008.4770378
Filename
4770378
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