• DocumentCode
    2555333
  • Title

    Carrier velocity in carbon nano tube field effect transistor

  • Author

    Ahmadi, Mohammad Taghi ; Saad, Ismail ; Karamdel, Javad ; Ismail, Razali ; Arora, Vijay K.

  • Author_Institution
    Fac. of Electr. Eng., Univ. Teknol. Malaysia, Skudai
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    519
  • Lastpage
    523
  • Abstract
    The fact that there are no dangling bond states at the surface of CNT allows for a wide choice of gate insulators. There fore the CNT are being considered as viable candidates for high-speed applications. The mobility and saturation velocity are the two important parameters that control the charge transport in a conducting MOSFET channel. It is shown that the high mobility does not always lead to higher carrier velocity. The ultimate drift velocity in carbon nanotube due to the high electric-field streaming are based on the asymmetrical distribution function that converts randomness in zero-field to streamlined one in a very high electric field. The limitation drift velocity is found to be appropriate thermal velocity for non-degenerate regime, increasing with the temperature, but independent of carrier concentration. However, the limitation drift velocity is the Fermi velocity for degenerate regime increasing with carrier concentration but independent of the temperature.
  • Keywords
    MOSFET; carbon nanotubes; carrier mobility; field effect transistors; Fermi velocity; MOSFET channel; asymmetrical distribution function; carbon nanotube; carrier velocity; charge transport; electric-field streaming; field effect transistor; Bonding; Carbon nanotubes; Electron mobility; Equations; FETs; Java; Nanoelectronics; Particle scattering; Silicon compounds; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770378
  • Filename
    4770378