• DocumentCode
    2555475
  • Title

    On-wafer integration of nitrides and Si devices: Bringing the power of polarization to Si

  • Author

    Chung, Jinwook W. ; Lu, Bin ; Palacios, Tomás

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    1117
  • Lastpage
    1120
  • Abstract
    The seamless integration of AlGaN/GaN transistors and Si CMOS electronics on the same chip will revolutionize digital and mixed signal electronics. In this talk we describe our group´s effort on demonstrating this integration. Si-GaN-Si virtual substrates have been recently fabricated through substrate removal and wafer bonding processes. The very high thermal stability of nitrides allows for the fabrication of Si CMOS electronics on these substrates without degrading the performance of the embedded nitride layer. In addition, GaN transistors on Si (001) have been fabricated on these substrates for the first time. Some of the many new circuits and devices that this integration allows include high power analog-to-digital converters, high speed differential amplifiers, normally-off power transistors, and highly-compact power regulator circuits.
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium compounds; polarisation; silicon; thermal stability; transistors; wafer bonding; wide band gap semiconductors; AlGaN-GaN; CMOS electronics; Si; analog-to-digital converter; differential amplifiers; nitride layer; on-wafer integration; power regulator circuit; substrate removal; thermal stability; transistors; virtual substrates; wafer bonding; Aluminum gallium nitride; Analog-digital conversion; Circuit stability; Fabrication; Gallium nitride; Polarization; Thermal degradation; Thermal stability; Transistors; Wafer bonding; HEMT; High Electron Mobility Transistor; Integration; MOSFET; Nitride Semiconductors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165897
  • Filename
    5165897