DocumentCode :
2555566
Title :
Site attenuation calculation of ferrite chamber
Author :
Shimada, Kazuo ; Takeya, Shigeru
Author_Institution :
Kashima Tech. Center, Riken Eletech Corp., Ibaraki, Japan
fYear :
1994
fDate :
22-26 Aug 1994
Firstpage :
393
Lastpage :
398
Abstract :
In a previous paper the authors measured the values of S parameter of radio-frequency (RF) absorbers, using a large square coaxial line at frequencies below 100 MHz and evaluated the results [S. Takeya, K. Shimada “New measurement of RF absorber characteristics by large square coaxial line”, 1993 IEEE International Symposium on EMC]. The present authors used the results obtained from the large coaxial line to simulate the site attenuation of a ferrite chamber and compared the simulation results with actually measured results. When the measurement results of a small coaxial line (39 mm diameter) were used, the accuracy of the calculation results was not high. Therefore, they adopted the results obtained from measurements made with the large coax, which represent the effects of gaps between ferrite tiles, and confirmed the improvement of simulation accuracy. This enabled to numerically analyze the site attenuation which varied depending on the sizes of gaps of the ferrite tiles, i.e., the difference in fabrication and placement conditions of RF absorbers. The authors were then able to apply this analysis to the design of ferrite chambers
Keywords :
anechoic chambers; electromagnetic compatibility; electromagnetic wave absorption; ferrites; S parameter; fabrication; ferrite chamber; ferrite tiles; gaps; large square coaxial line; placement conditions; radio-frequency absorbers; site attenuation calculation; Accuracy; Attenuation measurement; Coaxial components; Electromagnetic compatibility; Fabrication; Ferrites; Frequency measurement; Radio frequency; Scattering parameters; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
Type :
conf
DOI :
10.1109/ISEMC.1994.385626
Filename :
385626
Link To Document :
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