DocumentCode :
2555610
Title :
Stable time domain solutions for EMC problems using PEEC circuit models
Author :
Ruehli, Albert ; Miekkala, Ulla ; Bellen, Alfredo ; Heeb, Hansruedi
Author_Institution :
Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1994
fDate :
22-26 Aug 1994
Firstpage :
371
Lastpage :
376
Abstract :
Time domain solutions for electromagnetic problems are important for many EMC applications like ESD and integrated circuit EMI. The most common solution formulation for such problems is based on integral equations. The instabilities in the solution associated with integral equation techniques in the time domain are well known. In this paper we show that the instability may be either due to the numerical technique used for the time integration or due to problems created by the discrete representation for the solution of the problem by the numerical integration technique. We use the Partial Element Equivalent Circuit (PEEC) formulation of the EFIE integral equation for small model problems and some popular integration techniques to give specific examples of instabilities in the time domain solution. Importantly, we introduce techniques which lead to stable results
Keywords :
electric fields; electromagnetic compatibility; electrostatic discharge; equivalent circuits; integral equations; integrated circuit modelling; integration; numerical stability; time-domain analysis; EFIE; EMC problems; ESD; PEEC circuit models; discrete representation; electric field integral equation; electromagnetic problems; instability; integrated circuit EMI; numerical integration; numerical technique; partial element equivalent circuit; small model problems; time domain solutions; time integration; Circuit stability; Delay; Differential equations; Electromagnetic compatibility; Electrostatic discharge; Equivalent circuits; Integral equations; Integrated circuit modeling; Mathematical model; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
Type :
conf
DOI :
10.1109/ISEMC.1994.385629
Filename :
385629
Link To Document :
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