Title :
Improvement of metrological characteristics in computer-based digital oscilloscope systems
Author :
Semianovich, S.N. ; Stetsko, I.P. ; Tchoudovski, V.A.
Keywords :
Oscilloscopes;
Conference_Titel :
Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on
Print_ISBN :
0-7803-8442-3
DOI :
10.1109/APEDE.2004.1393584
