DocumentCode :
2555704
Title :
A 3.4 – 6.2 GHz Continuously tunable electrostatic MEMS resonator with quality factor of 460–530
Author :
Liu, Xiaoguang ; Katehi, Linda P B ; Chappell, William J. ; Peroulis, Dimitrios
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
1149
Lastpage :
1152
Abstract :
In this paper we present the first MEMS electrostatically-tunable loaded-cavity resonator that simultaneously achieves a very high continuous tuning range of 6.2 GHz:3.4 GHz (1.8:1) and quality factor of 460-530 in a volume of 18 times 30 times 4 mm3 including the actuation scheme and biasing lines. The operating principle relies on tuning the capacitance of the loaded-cavity by controlling the gap between an electrostatically-actuated membrane and the cavity post underneath it. Particular attention is paid on the fabrication of the tuning mechanism in order to avoid a) quality factor degradation due to the biasing lines and b) hysteresis and creep issues. A single-crystal silicon membrane coated with a thin gold layer is the key to the success of the design.
Keywords :
cavity resonators; electrostatic devices; micromechanical resonators; cavity resonator; electrostatic MEMS resonator; electrostatically-actuated membrane; frequency 3.4 GHz to 6.2 GHz; quality factor; single-crystal silicon membrane; tuning mechanism; Biomembranes; Capacitance; Creep; Degradation; Electrostatics; Fabrication; Hysteresis; Micromechanical devices; Q factor; Silicon; Evanescent-mode cavity; MEMS; quality factor; tunable filter; tunable resonator; tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165905
Filename :
5165905
Link To Document :
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