DocumentCode :
2555801
Title :
Enhancing the efficiency of a field free line scanning device for magnetic particle imaging
Author :
Erbe, Marlitt ; Sattel, Timo F. ; Knopp, T. ; Buzug, Thorsten M.
Author_Institution :
Inst. of Med. Eng., Univ. of Luebeck, Luebeck, Germany
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
2566
Lastpage :
2568
Abstract :
Magnetic particle imaging (MPI) is a novel functional imaging modality capable of detecting a distribution of superparamagnetic iron oxide (SPIO) tracer material in-vivo in 3D and real-time. Conventional MPI uses a sensitive spot method to scan the region of interest. To increase the sensitivity, however, an alternative encoding scheme using a line detection method was introduced. To provide the magnetic fields needed for dynamic line scanning in MPI a very efficient imager with respect to power consumption is needed. At the same time, the imager needs to provide a high magnetic field quality to ensure that no artifacts are introduced using efficient Radon-based reconstruction methods arising for a line encoding scheme. In this work, the most efficient dynamic FFL scanner design is presented, which outperforms all formerly introduced scanners with respect to magnetic field quality as well as electrical power consumption.
Keywords :
biomedical MRI; image coding; image reconstruction; image scanners; image sensors; iron compounds; magnetic particles; magnetic sensors; medical image processing; superparamagnetism; MPI; ROI scanning; Radon-based reconstruction method; SPIO tracer material detection; alternative encoding scheme; dynamic FFL scanner design; dynamic line scanning; electrical power consumption; field free line scanning device; functional imaging modality; imager; line detection method; line encoding scheme; magnetic field quality; magnetic particle imaging; region of interest; sensitive spot method; superparamagnetic iron oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551587
Filename :
6551587
Link To Document :
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