Title :
A useful etchant to create cavitations of cobalt salicide layer in a cross-sectioned sample
Author :
Ping, Alvin Chan Tze
Author_Institution :
X-FAB Sarawak Sdn Bhd, Kuching
Abstract :
Traditional cross-sectional sample treatment methods such as BOE (Buffered oxide etch), can easily highlight Titanium Salicide (TiSi2) by etching away the TiSi2 (thus creating voids or cavitations) with no impact on the silicon underneath the salicide. However, this method does not work for devices using Cobalt Salicide (CoSi2) technology. The work presented here is to introduce a special etchant or chemical mix that will etch the Cobalt Salicide (CoSi2), with no significant impact on the silicon underneath the salicide layer.
Keywords :
cavitation; cobalt compounds; etching; voids (solid); CoSi2; buffered oxide etch; cavitations; chemical mix; cobalt salicide layer; etchant; etching; silicon; voids; Chemical technology; Cobalt; Contact resistance; Etching; Semiconductor devices; Semiconductor materials; Silicon; Surface treatment; Switches; Titanium;
Conference_Titel :
Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4244-3873-0
Electronic_ISBN :
978-1-4244-2561-7
DOI :
10.1109/SMELEC.2008.4770401