Title : 
A XML-based Testing Tool for Embedded Softwares
         
        
            Author : 
Kwack, Dongkyu ; Cho, Yongyun ; Choi, Jaeyoung ; Yoo, Chae-Woo
         
        
            Author_Institution : 
Soongsil Univ., Seoul
         
        
        
        
        
        
            Abstract : 
Because embedded systems commonly have slow processor and small memory, embedded software must be more efficient and compact against the poor resource. In this paper, we suggest a tool to easily test embedded program´s performance and intuitively report the results with graphical views. The suggested tool is pure software without any additional hardware to test embedded software´s performance, so developers can save development cost and time. To improve the usability and the reusability for test scripts and testing results, we design XML-based DTDs for those. Through the graphical views, developers can intuitively analyze software´s test results and easily understand the meaning of the results. Developers can easily revise the test scripts to try to various testing their embedded softwares. We hope that the suggested tool will be useful for embedded-related software development. The test suite generator offers a test script wizard for users to easily make a test driver. The report generator converts a string-type result to an XML-based class instance in order to raise reusability for the result.
         
        
            Keywords : 
XML; embedded systems; program testing; software performance evaluation; XML-based DTD; XML-based testing tool; embedded softwares; software testing; Debugging; Embedded computing; Embedded software; Embedded system; Hardware; Software performance; Software testing; Software tools; System testing; Telecommunications;
         
        
        
        
            Conference_Titel : 
Multimedia and Ubiquitous Engineering, 2007. MUE '07. International Conference on
         
        
            Conference_Location : 
Seoul
         
        
            Print_ISBN : 
0-7695-2777-9
         
        
        
            DOI : 
10.1109/MUE.2007.62