Algorithms of the shaping different type test tasks on base of the tasks on correspondence to when designing parallel and local test

Author

Zaharov, A.A. ; Kolpakov, A.V. ; Kalashnikova, E.N.

fYear

2004

fDate

15-16 Sept. 2004

Firstpage

386

Lastpage

393

Keywords

Algorithm design and analysis; Mirrors; Silicon carbide; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on

Print_ISBN

0-7803-8442-3

Type

DOI

10.1109/APEDE.2004.1393596

Filename

1393596

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