Title :
Mathematical modeling structured and quantitative features upshot under free count; calculate; list event and their sign
Author :
Zaharov, A.A. ; Kashirin, E.G.
Keywords :
Mathematical model; Testing;
Conference_Titel :
Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on
Print_ISBN :
0-7803-8442-3
DOI :
10.1109/APEDE.2004.1393599
