Mathematical modeling structured and quantitative features upshot under free count; calculate; list event and their sign

Author

Zaharov, A.A. ; Kashirin, E.G.

fYear

2004

fDate

15-16 Sept. 2004

Firstpage

411

Lastpage

416

Keywords

Mathematical model; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on

Print_ISBN

0-7803-8442-3

Type

DOI

10.1109/APEDE.2004.1393599

Filename

1393599

Link To Document