Title :
An improved method of characterizing shielding materials
Author :
Smith, Douglas C. ; Herring, Chauncey ; Haynes, Richard
Author_Institution :
Eng. Res. Center, AT&T Bell Labs., Princeton, NJ, USA
Abstract :
Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements
Keywords :
electromagnetic shielding; magnetic fields; materials testing; plastics; coated plastics; loaded plastics; perpendicular magnetic field; plane wave far field measurements; shielding effectiveness measurement; shielding materials; Circuit testing; Conducting materials; Flanges; Impedance; Magnetic field measurement; Magnetic materials; Magnetic shielding; Materials testing; Printed circuits; TEM cells;
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
DOI :
10.1109/ISEMC.1994.385657
