DocumentCode
2556190
Title
An Immune Approach to Autonomic Quality system for Complex Production System
Author
Zhang, Genbao ; Zeng, Haifeng ; Wang, Guoqiang
Author_Institution
Coll. of Mec. Eng., Chongqing Univ., Chongqing
fYear
2008
fDate
4-4 Dec. 2008
Firstpage
18
Lastpage
23
Abstract
Product quality is a major concern for manufacturing enterprises, so it is of key importance to monitor and control the soundness and effectiveness of production systems. Centralized and hierarchical control architectures that characterized by strong master-slave relationships is still widely used. But with the increasing complexity of the production system and the products itself, quality control for CPS (Complex Production System) becomes more and more difficult. Based on the analysis of quality system requirement for CPS, we found that autonomic system is a potentially useful quality paradigm for CPS. But a completely decentralized solution is unstable and prohibitively complex. A compromise has to be found. This paper draws inspiration from biological immune system to learn valuable lessons for autonomic manufacturing defense system. Important immunological metaphors, such as feature extraction, learing, memory, and its distributive nature are utilized to adapt to the new requirements of quality system for CPS.
Keywords
knowledge based systems; large-scale systems; production control; quality control; autonomic manufacturing defense system; autonomic quality system; complex production system; control architectures; feature extraction; immune approach; immunological metaphors; learning; manufacturing enterprises; master-slave relationships; product quality; quality system requirement; Centralized control; Control systems; Educational institutions; Face detection; Immune system; Manufacturing; Monitoring; Production systems; Protection; Quality control; autonomic; complex production system; immune principle; quality;
fLanguage
English
Publisher
ieee
Conference_Titel
System Integration, 2008 IEEE/SICE International Symposium on
Conference_Location
Nagoya
Print_ISBN
978-1-4244-3838-9
Electronic_ISBN
978-1-4244-2209-8
Type
conf
DOI
10.1109/SI.2008.4770420
Filename
4770420
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