• DocumentCode
    2556212
  • Title

    An algorithm to reduce automated emission measurement data

  • Author

    Crain, Bruce R.

  • Author_Institution
    Tech. Res. Inst., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1994
  • fDate
    22-26 Aug 1994
  • Firstpage
    215
  • Lastpage
    220
  • Abstract
    When performing automated measurement of electromagnetic interference (EMI) emission characteristics of an equipment, the resulting data sets can contain hundreds or thousands of data points. From the standpoint of an engineer trying to assess the electromagnetic compatibility (EMC) of the equipment in a particular platform, the envelope of the emission spectrum is typically of greatest importance. It is desirable to have an automated method of reducing the large data set into a compact set that contains only those points which represent a close approximation to the spectrum envelope. An algorithm has been developed which performs automated reduction of emission data. The degree of reduction can be varied by the user through the choice of two parameters. Trial results show that the algorithm performs very well in approximating the envelope of typical emission curves
  • Keywords
    automatic testing; data reduction; electrical engineering computing; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; EMC; EMI; automated emission measurement data; data reduction; electromagnetic compatibility; electromagnetic interference; emission characteristics; emission curves; emission spectrum envelope; equipment; Algorithm design and analysis; Current measurement; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Frequency measurement; Particle measurements; Performance evaluation; Radio frequency; Software algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1398-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1994.385659
  • Filename
    385659