• DocumentCode
    2556260
  • Title

    Phenomenological approach for ESD immunity design

  • Author

    Rhoades, William T.

  • Author_Institution
    Xerox Corp., El Segundo, CA, USA
  • fYear
    1994
  • fDate
    22-26 Aug 1994
  • Firstpage
    209
  • Lastpage
    214
  • Abstract
    It is verified that, a 330 ohm/l50 pF ESD contact discharge simulator met the IEC 801-2 requirements in 150 ps and 350 ps rise time test setups. This same ESD simulator using air discharge in a 150 ps test setup, with a charge voltage, between 2 and 8 kV had a peak current 2 times higher and a rise time of 1/6 of the contact values. A five step design order is presented to achieve cost effective ESD equipment immunity design. The key consideration for obtaining this design is the understanding of the common-mode (CM) ESD current path. A number of examples illustrate this key from the simple reset hardening to the advance concept of ESD differential termination of the converted transient and using a CM inductor to improve the CM rejection in the receptor
  • Keywords
    electronic equipment testing; electrostatic discharge; simulation; test equipment; 150 pF; 150 ps; 2 kV; 320 ohm; 350 ps; 8 kV; CM inductor; CM rejection; ESD contact discharge simulator; ESD differential termination; ESD immunity design; IEC 801-2 requirements; air discharge; charge voltage; common-mode ESD current path; converted transient; five step design order; peak current; reset hardening; rise time test setups; ANSI standards; Bandwidth; Discrete event simulation; Electrostatic discharge; Humidity; IEC standards; Instruments; Testing; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1398-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1994.385660
  • Filename
    385660