Analysis of the measured field structure in a GTEM 1750

Author

Hansen, Diethard ; Ristau, Detlef ; Spaeth, Thomas ; Radasky, William A. ; Smith, Kenneth S. ; Gilbert, James L.

Author_Institution

Euro EMC Service, Teltow, Germany

fYear

1994

fDate

22-26 Aug 1994

Firstpage

144

Lastpage

149

Abstract

An experimental field mapping (x, y, z components) of a GTEM 1750 has been performed in important parts and locations of this asymmetrical waveguide. The measurement results of deviations from the perfect TEM wave reveal some non TEM components as a function of exciting frequency and measurement location. A review of the present state of theoretical and experimental research with respect to immunity is given. An attempt is made to simulate a generic GTEM 500 section by using a 3-D finite difference time domain code. A comparison with measured data is presented, including the analysis of fundamental problems in the presently used standardized field sensor instrumentation

Keywords

electromagnetic compatibility; electromagnetic fields; field plotting; finite difference time-domain analysis; finite element analysis; rectangular waveguides; 3-D finite difference time domain code; EMC; GHz TEM cell; GTEM 1750; asymmetrical waveguide; exciting frequency; experimental field mapping; field structure; generic GTEM 500 section; immunity; measurement location; perfect TEM wave; review; standardized field sensor instrumentation; Electromagnetic compatibility; Finite difference methods; Frequency domain analysis; Immunity testing; Instruments; Licenses; Project management; Resistors; TEM cells; Waveguide components;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on

Conference_Location

Chicago, IL

Print_ISBN

0-7803-1398-4

Type

conf

DOI

10.1109/ISEMC.1994.385667

Filename

385667