• DocumentCode
    2556444
  • Title

    Treeing, a mechanism of breakdown in solid dielectrics

  • Author

    Eichhorn, Robert M.

  • Author_Institution
    Union Carbide Chem. & Plastics Co. Inc., Somerset, NJ, USA
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    2
  • Lastpage
    3
  • Abstract
    Some general considerations on the treeing phenomenon are presented. Attention is given to the practical breakdown strengths of solid dielectrics and to mechanisms proposed for the breakdown of solid dielectrics under high electrical stress
  • Keywords
    electric breakdown of solids; electric strength; breakdown strengths; high electrical stress; solid dielectrics; treeing phenomenon; Bonding; Cables; Chemicals; Conducting materials; Dielectric breakdown; Electric breakdown; Electrodes; Plastics; Solids; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109695
  • Filename
    109695
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2556444