Title :
Treeing, a mechanism of breakdown in solid dielectrics
Author :
Eichhorn, Robert M.
Author_Institution :
Union Carbide Chem. & Plastics Co. Inc., Somerset, NJ, USA
Abstract :
Some general considerations on the treeing phenomenon are presented. Attention is given to the practical breakdown strengths of solid dielectrics and to mechanisms proposed for the breakdown of solid dielectrics under high electrical stress
Keywords :
electric breakdown of solids; electric strength; breakdown strengths; high electrical stress; solid dielectrics; treeing phenomenon; Bonding; Cables; Chemicals; Conducting materials; Dielectric breakdown; Electric breakdown; Electrodes; Plastics; Solids; Thermal stresses;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109695
