Title :
High-power reflection coefficient measurement of biological material applicable to microwave hyperthermia
Author :
Kim, Namgon ; Yoon, Jeonghoon ; Cheon, Changyul ; Kwon, Youngwoo
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Abstract :
A measurement method for the high-power reflection coefficients of biological material applicable to microwave hyperthermia is presented. To extract the power-dependent complex permittivities, scalar S-parameter measurement setup consisting of a planar coaxial probe, impedance tuner, directional couplers, and power meters have been used. The tuner impedance was tuned until the reflected power reading was zeroed out, and subsequent de-embedding steps accounting for the non-idealities were followed to extract the reflection coefficient of the material under test at the coaxial aperture. To validate the proposed measurement method, the reflection coefficients of the distilled water were measured with various microwave powers at heated temperatures. The extracted complex permittivities showed good agreement with the reference data over broad temperature and frequency range. The method provides an effective way of in-situ monitoring during the hyperthermia and experimental data for thermal-electromagnetic analysis.
Keywords :
biomedical materials; hyperthermia; microwave heating; permittivity; permittivity measurement; biological material; complex permittivity; directional couplers; distilled water; high-power reflection coefficient measurement; impedance tuner; microwave hyperthermia; planar-type coaxial probe; power meters; scalar S-parameter measurement setup; thermal-electromagnetic analysis; Biological materials; Coaxial components; Electromagnetic heating; Hyperthermia; Impedance; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Reflection; Tuners; Complex permittivity; high-power reflection coefficient; hyperthermia; planar-type coaxial probe;
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2009.5165944