Title :
A model of solid dielectrics aging
Author :
Crine, Jean-Pierre
Author_Institution :
IREQ, Varennes, Que., Canada
Abstract :
A simple aging model based on a modified version of the Eyring rate equation is presented that describes very well the electrical and mechanical aging of polymer dielectrics. In particular, the electrical aging of XLPE (cross-linked polyethylene) cables is well described. It is also shown that the onset of irreversible electrical aging occurs above a critical field whose value can be predicted by the proposed model. This corresponds to the formation of submicrocavities whose average size is controlled by the amorphous phase length of the polymer
Keywords :
ageing; cable insulation; insulation testing; organic insulating materials; polymers; power cables; Eyring rate equation; XLPE; aging model; amorphous phase length; cables; electrical aging; irreversible electrical aging; mechanical aging; polymer dielectrics; solid dielectrics aging; submicrocavities; Aging; Amorphous materials; Cables; Dielectrics; Equations; Polyethylene; Polymers; Predictive models; Size control; Solid modeling;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109700
