Circuital analysis of a coaxial re-entrant cavity for performing dielectric measurement

Author

Penaranda-Foix, Felipe L. ; Catala-Civera, Jose M. ; Canos-Marin, Antoni J. ; Garcia-Banos, Beatriz

Author_Institution

ITACA-UPV, Valencia, Spain

fYear

2009

fDate

7-12 June 2009

Firstpage

1309

Lastpage

1312

Abstract

We apply circuital analysis to the re-entrant cavity method for measuring the relative permittivity and loss tangent of dielectric material. With this new model, we are able to make use of the higher-order resonant modes of the re-entrant cavity, and are therefore able to broaden the frequency range over which we can measure the dielectric properties of the sample. We compare this new model with others in the literature and validate its capabilities through a comparison with other dielectric measurement techniques.

Keywords

cavity resonators; coaxial cables; microwave measurement; network analysis; permittivity measurement; circuital analysis; coaxial reentrant cavity; dielectric material; dielectric measurement; relative permittivity; Circuit analysis; Coaxial components; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Performance analysis; Performance evaluation; Permittivity measurement; Coaxial re-entrant cavity; coaxial gap; dielectric; loss tangent; permittivity measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International

Conference_Location

Boston, MA

ISSN

0149-645X

Print_ISBN

978-1-4244-2803-8

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2009.5165945

Filename

5165945