DocumentCode :
2556674
Title :
A test sequences optimization method for improving fault coverage
Author :
Wang, Qiang ; Wang, Shuai ; Ji, Yindong
Author_Institution :
Dept. of Autom., Tsinghua Univ., Beijing, China
fYear :
2010
fDate :
16-18 April 2010
Firstpage :
80
Lastpage :
84
Abstract :
Conformance testing for communication protocol is an active research field. But most research on test sequences generation and optimization focus on how to reduce the length of a test sequence or the automatic generation process. Less attention has been paid on how to improve the fault coverage of test sequences. Many test sequence generation methods, such as UIO method, do not guarantee complete fault coverage. In this paper, we propose a test sequences optimization method to raise fault coverage of UIO method. In this method, some key test sequences will be added to the former test suit, based on fault coverage evaluation results. Results show that this method could effectively improve the fault coverage without re-generating the whole set of test sequences. The experimental results given in Section 4 show that it could help to detect more distinguishable FSMs than former testing methods. This optimization method could not only be used on test sequences generated by UIO method, but also be added as an extended section of many other generation methods to improve test sequences generated.
Keywords :
conformance testing; fault diagnosis; finite state machines; protocols; FSM; UIO method; communication protocol; conformance testing; fault coverage; test sequence generation; test sequences optimization; Automata; Automatic testing; Automation; Information science; Laboratories; Optimization methods; Protocols; System analysis and design; System testing; Conformance testing; fault coverage; finite state machine (FSM); test sequences optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5263-7
Electronic_ISBN :
978-1-4244-5265-1
Type :
conf
DOI :
10.1109/ICIME.2010.5478197
Filename :
5478197
Link To Document :
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