DocumentCode
2556801
Title
A spice model for predicting static thermal coupling between bipolar transistors
Author
Beckrich, Helene ; Schwartzmann, Thierry ; Celi, Didier ; Zimmer, Thomas
Volume
2
fYear
2005
fDate
25-28 July 2005
Firstpage
75
Lastpage
78
Keywords
Bipolar transistors; Current density; Current measurement; Electric breakdown; Electronic mail; Heating; Predictive models; SPICE; Temperature; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Research in Microelectronics and Electronics, 2005 PhD
Print_ISBN
0-7803-9345-7
Type
conf
DOI
10.1109/RME.2005.1542940
Filename
1542940
Link To Document