Dielectric breakdown due to hole avalanche in plasma polymer films

Author

Ishii, K. ; Ohki, Y. ; Nakano, T.

Author_Institution

Dept. of Electr. Eng., Waseda Univ., Tokyo, Japan

fYear

1990

fDate

3-6 Jun 1990

Firstpage

76

Lastpage

79

Abstract

High-field conduction and dielectric breakdown characteristics of plasma-polymerized films of ethylene and trifluoromethane (PPEF) and those of ethylene (PPE) were studied. Based on experimental results on the prebreakdown current, time lag to breakdown, and thickness or electrode metal dependence on dielectric strength, it is shown that the breakdown is caused by hole avalanche and that scattering of holes by fluorine atoms results in higher dielectric strength in PPEF than in PPE

Keywords

electric breakdown of solids; electric strength; impact ionisation; polymer films; PPE; PPEF; dielectric breakdown characteristics; dielectric strength; electrode metal dependence; ethylene; high-field conduction; hole avalanche; plasma polymer films; prebreakdown current; thickness; time lag to breakdown; trifluoromethane; Avalanche breakdown; Breakdown voltage; Dielectric breakdown; Electric breakdown; Electrodes; Gold; Plasma measurements; Plasma properties; Polymer films; Pulse measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on

Conference_Location

Toronto, Ont.

ISSN

1089-084X

Type

conf

DOI

10.1109/ELINSL.1990.109712

Filename

109712