Title :
Design of a path delay fault simulator for evaluation of abist generated stimuli
Author :
Gjermundnes, Øystein ; Aas, Einar J.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Delay; Electrical fault detection; Electronic mail; Fault detection; Integrated circuit modeling; Robustness; Test pattern generators;
Conference_Titel :
Research in Microelectronics and Electronics, 2005 PhD
Print_ISBN :
0-7803-9345-7
DOI :
10.1109/RME.2005.1542948
