Title :
Oxides - Ultra Thin Oxides
Author :
Vollertsen, Rolf-Peter ; Dumin, Dave J.
Keywords :
Acceleration; Assembly; Electric breakdown; Internet; Manufacturing; Microelectronics; Rivers; Time measurement; Voltage; Voting;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1998. IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4881-8
DOI :
10.1109/IRWS.1998.745376
