DocumentCode :
2557037
Title :
Thermally induced stresses in semiconductor laser packaging
Author :
Yang, I.D. ; Wang, W.H. ; Kuang, J.H. ; Cheng, W.H.
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume :
2
fYear :
1996
fDate :
18-21 Nov. 1996
Firstpage :
242
Abstract :
The thermally induced stresses in the laser welding technique for semiconductor laser packaging are calculated by using the finite-element method (FEM). Results obtained from stainless-to-Kovar joints indicate that the Kovar with an Au coating shows a higher stress than that without a coating. There is satisfactory agreement between experimental results and the finite-element predictions that the higher stresses induced by Au in Kovar during the welding process are a possible cause for surface cracks.
Keywords :
finite element analysis; laser beam welding; semiconductor device packaging; semiconductor lasers; thermal stress cracking; thermal stresses; transient analysis; Au; Au coating; FEM; laser welding technique; numerical simulation; semiconductor laser packaging; stainless-to-Kovar joints; surface cracks; thermally induced stresses; transient stresses; Coatings; Computational modeling; Fiber lasers; Gold; Laser modes; Residual stresses; Semiconductor device packaging; Semiconductor lasers; Thermal stresses; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
Type :
conf
DOI :
10.1109/LEOS.1996.571643
Filename :
571643
Link To Document :
بازگشت