DocumentCode :
2557053
Title :
Electrostatic Discharge - ESD
Author :
Gieser, Horst ; Worley, Eugene
fYear :
1998
fDate :
15-15 Oct. 1998
Firstpage :
94
Lastpage :
96
Keywords :
Biological system modeling; Breakdown voltage; Electrostatic discharge; Humans; Packaging; Protection; Semiconductor device modeling; Stress; Testing; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1998. IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4881-8
Type :
conf
DOI :
10.1109/IRWS.1998.745377
Filename :
745377
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2557053
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