DocumentCode :
2557062
Title :
Proceedings of IEEE Symposium on Electromagnetic Compatibility
fYear :
1994
fDate :
22-26 Aug. 1994
Abstract :
The following topics were dealt with: EMC measurements, analysis, management and test facilities; spectrum management and product safety; immunity testing; computational electromagnetics; radiated emissions; interference modelling; transient modelling; shielding; nonsinusoidal fields; electromagnetic environment; ferrite absorber; lightning; crosstalk
Keywords :
crosstalk; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; electromagnetic shielding; lightning; test facilities; EMC measurements; computational electromagnetics; crosstalk; electromagnetic compatability; electromagnetic environment; ferrite absorber; immunity testing; interference modelling; lightning; nonsinusoidal fields; product safety; radiated emissions; shielding; spectrum management; test facilities; transient modelling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-1398-4
Type :
conf
DOI :
10.1109/ISEMC.1994.385696
Filename :
385696
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2557062
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