• DocumentCode
    2557329
  • Title

    Enhancement of SiGe HBT Linearity Characteristics with Current Source Bias

  • Author

    Qin, Guoxuan ; Wang, Guogong ; Ma, Zhenqiang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI
  • fYear
    2009
  • fDate
    19-21 Jan. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Linearity characteristics in terms of two-tone third order intermodulation distortion (IMD3) for common-emitter (CE) SiGe heterojunction bipolar transistors (HBT) are investigated at high frequency (6 GHz) with impedance matched for maximum output power. An approach to enhancing the linearity of SiGe HBTs at their high input power levels through the use of current bias instead of voltage bias is presented for the first time. Both measurements and simulations show that SiGe HBT linearity under high input power level (severe gain compression) can be improved. The reasons responsible for the linearity enhancement are discussed.
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; impedance matching; semiconductor device models; semiconductor materials; HBT linearity characteristics; SiGe; common-emitter heterojunction bipolar transistors; current source bias; frequency 6 GHz; gain compression; impedance matching; input power levels; output power; two-tone third order intermodulation distortion; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Impedance matching; Intermodulation distortion; Linearity; Power generation; Power measurement; Silicon germanium; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-3940-9
  • Electronic_ISBN
    978-1-4244-2831-1
  • Type

    conf

  • DOI
    10.1109/SMIC.2009.4770506
  • Filename
    4770506