DocumentCode
2557329
Title
Enhancement of SiGe HBT Linearity Characteristics with Current Source Bias
Author
Qin, Guoxuan ; Wang, Guogong ; Ma, Zhenqiang
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI
fYear
2009
fDate
19-21 Jan. 2009
Firstpage
1
Lastpage
4
Abstract
Linearity characteristics in terms of two-tone third order intermodulation distortion (IMD3) for common-emitter (CE) SiGe heterojunction bipolar transistors (HBT) are investigated at high frequency (6 GHz) with impedance matched for maximum output power. An approach to enhancing the linearity of SiGe HBTs at their high input power levels through the use of current bias instead of voltage bias is presented for the first time. Both measurements and simulations show that SiGe HBT linearity under high input power level (severe gain compression) can be improved. The reasons responsible for the linearity enhancement are discussed.
Keywords
Ge-Si alloys; heterojunction bipolar transistors; impedance matching; semiconductor device models; semiconductor materials; HBT linearity characteristics; SiGe; common-emitter heterojunction bipolar transistors; current source bias; frequency 6 GHz; gain compression; impedance matching; input power levels; output power; two-tone third order intermodulation distortion; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Impedance matching; Intermodulation distortion; Linearity; Power generation; Power measurement; Silicon germanium; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-3940-9
Electronic_ISBN
978-1-4244-2831-1
Type
conf
DOI
10.1109/SMIC.2009.4770506
Filename
4770506
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