• DocumentCode
    255752
  • Title

    Fringe analysis software: Application to velocity measurement in dynamic compression experiment

  • Author

    Sur, A. ; Rav, A.S. ; Joshi, K.D. ; Gupta, S.C. ; Roy, K.

  • Author_Institution
    Appl. Phys. Div., Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2014
  • fDate
    11-13 Dec. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Optical technique such as laser Doppler interferometry is quite popular for non contact measurement and has been applied in free surface velocity measurement in dynamic compression experiment. In this technique the information of measured physical quantity such as surface velocity is encoded in the phase of a fringe pattern. Fringe analysis software extracts the phase from the fringe pattern. The present work reports the development of robust fringe analysis software for complete time history of free surface velocity measurement from recorded fringe signals. The analysis code has been verified by generating free surface velocity history from different simulated fringe profiles. The effects of various measurement imperfections are also studied and corrective measures are coded in the software. Finally, software is validated by analyzing the plate impact experimental data of Al-2024T4 material. Good agreement was obtained between analysis result of experimental data and published data.
  • Keywords
    interferometers; optical engineering computing; signal denoising; velocity measurement; virtual instrumentation; wavelet transforms; Al-2024T4 material; LabVIEW; VISAR; analysis code; complete time history; dynamic compression experiment; free surface velocity history; free surface velocity measurement; fringe analysis software; fringe pattern; fringe profiles; fringe signals; laser Doppler interferometry; measured physical quantity; measurement imperfections; noncontact measurement; optical technique; plate impact experimental data; signal denoising; software validation; velocity interferometer system for any reflector; wavelet; Fitting; Noise; Noise reduction; Optical interferometry; Optical surface waves; Software; Velocity measurement; Denoising; Ellipse fitting; LabVIEW; Phase Unwrapping; VISAR; Wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2014 Annual IEEE
  • Conference_Location
    Pune
  • Print_ISBN
    978-1-4799-5362-2
  • Type

    conf

  • DOI
    10.1109/INDICON.2014.7030619
  • Filename
    7030619