• DocumentCode
    2557727
  • Title

    HB-based CAD-oriented dynamic stability analysis of circuits and devices: Application to the assessment of thermal instabilities in multifinger HBTs

  • Author

    Traversa, F.L. ; Cappelluti, F. ; Bonani, F. ; Ghione, G.

  • Author_Institution
    Dipt. di Elettron., Politec. di Torino, Torino, Italy
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    1493
  • Lastpage
    1496
  • Abstract
    We present a novel CAD-oriented approach to the analysis of thermal instabilities in power HBTs. The stability analysis is carried out in time-periodic dynamic conditions, by calculating the Floquet multipliers of the limit cycle representing the HBT working point. Such a computation is performed directly in the frequency domain, one the sole basis of the Jacobian of the harmonic balance problem yielding the limit cycle. The corresponding stability assessment is therefore rigorous, and the efficient calculation method makes it readily implementable in CAD tools allowing for circuit and device optimization. Results on 3- and 4-finger layouts are shown, including the assessment of popular stabilization techniques such as emitter ballasting and thermal shunt, thus demonstrating the possible use of the approach as an optimization tool.
  • Keywords
    circuit CAD; circuit analysis computing; heterojunction bipolar transistors; power engineering computing; power transistors; thermal stability; Floquet multipliers; HB-based CAD-oriented analysis; dynamic stability analysis; emitter ballasting; harmonic balance problem; multifinger HBT; power HBT; thermal instabilities; thermal shunt; time-periodic dynamic conditions; Circuit stability; Design automation; Design optimization; Electronic ballasts; Frequency domain analysis; Heterojunction bipolar transistors; Limit-cycles; Nonlinear dynamical systems; Performance analysis; Stability analysis; Electrothermal effects; Heterojunction bipolar transistors; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165991
  • Filename
    5165991