DocumentCode
2557727
Title
HB-based CAD-oriented dynamic stability analysis of circuits and devices: Application to the assessment of thermal instabilities in multifinger HBTs
Author
Traversa, F.L. ; Cappelluti, F. ; Bonani, F. ; Ghione, G.
Author_Institution
Dipt. di Elettron., Politec. di Torino, Torino, Italy
fYear
2009
fDate
7-12 June 2009
Firstpage
1493
Lastpage
1496
Abstract
We present a novel CAD-oriented approach to the analysis of thermal instabilities in power HBTs. The stability analysis is carried out in time-periodic dynamic conditions, by calculating the Floquet multipliers of the limit cycle representing the HBT working point. Such a computation is performed directly in the frequency domain, one the sole basis of the Jacobian of the harmonic balance problem yielding the limit cycle. The corresponding stability assessment is therefore rigorous, and the efficient calculation method makes it readily implementable in CAD tools allowing for circuit and device optimization. Results on 3- and 4-finger layouts are shown, including the assessment of popular stabilization techniques such as emitter ballasting and thermal shunt, thus demonstrating the possible use of the approach as an optimization tool.
Keywords
circuit CAD; circuit analysis computing; heterojunction bipolar transistors; power engineering computing; power transistors; thermal stability; Floquet multipliers; HB-based CAD-oriented analysis; dynamic stability analysis; emitter ballasting; harmonic balance problem; multifinger HBT; power HBT; thermal instabilities; thermal shunt; time-periodic dynamic conditions; Circuit stability; Design automation; Design optimization; Electronic ballasts; Frequency domain analysis; Heterojunction bipolar transistors; Limit-cycles; Nonlinear dynamical systems; Performance analysis; Stability analysis; Electrothermal effects; Heterojunction bipolar transistors; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location
Boston, MA
ISSN
0149-645X
Print_ISBN
978-1-4244-2803-8
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2009.5165991
Filename
5165991
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