Title :
Performance of supersmooth, extra clean semiconductive shields in XLPE insulated power cables
Author :
Burns, Norman M., Jr.
Author_Institution :
Union Carbide Chem. & Plastics Co. Inc., Somerset, NJ, USA
Abstract :
Supersmooth (SS), extra-clean semiconductor shields have been demonstrated to be markedly improved in extruded surface smoothness and to contain a minimal level of ionic impurities. In well-accepted accelerated cable aging tests for wet locations, where the SS extra-clean semiconductives are used as conductor shields, substantial improvements in cable performance have been demonstrated. Additional studies have shown that the SS extra-clean shields initiate far fewer vented water trees in the associated insulation. Both the SS ethylene ethyl acrylate (EEA) and SS ethylene vinyl acetate (EVA) products demonstrate these improved properties. When these superior semiconductives are combined with tree-retardant cross-linked polyethylene (TR-XLPE) insulation, the very best cable performance properties were obtained. It is concluded that, for cables that will be subjected to wet service conditions, the use of SS extra-clean conductor shields combined with TR-XLPE insulation will offer high-quality, cost-effective long-life cable construction
Keywords :
ageing; cable insulation; electric breakdown of solids; electric strength; environmental testing; life testing; materials testing; organic insulating materials; polymers; power cables; reliability; underground cables; EEA; EVA; TR-XLPE insulation; XLPE insulated power cables; accelerated cable aging tests for wet locations; cable performance properties; conductor shields; cost-effective long-life cable construction; ethylene ethyl acrylate; ethylene vinyl acetate; extra clean semiconductive shields; extra-clean semiconductor shields; fewer vented water trees; improved in extruded surface smoothness; improvements in cable performance; minimal level of ionic impurities; supersmooth semiconductor shields; tree-retardant cross-linked polyethylene; water treeing; well accepted aging tests; wet service conditions; Accelerated aging; Cable insulation; Cable shielding; Conductors; Life estimation; Polyethylene; Semiconductor device testing; Semiconductor impurities; Surface cleaning; Trees - insulation;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109754