Title :
The Impact of Substrate Noise on a 48-53GHz MM-Wave LC-VCO
Author :
Bronckers, S. ; Scheir, K. ; Van der Plas, G. ; Rolain, Y.
Author_Institution :
IMEC, Leuven
Abstract :
Substrate noise problems continue to harass the design of a System-on-a-Chip (SoC). It is not obvious for the designer to identify the dominant substrate noise entry points. This paper proposes a new approach to gain insight in and predict the impact of substrate noise on mm-wave circuits. The approach is validated by measurements on a CMOS 48-53 GHz LC-VCO, designed in a UMC 0.13 mum technology.
Keywords :
CMOS integrated circuits; millimetre wave integrated circuits; substrates; system-on-chip; voltage-controlled oscillators; CMOS; LC VCO; UMC technology; frequency 48 GHz to 53 GHz; mm-wave circuits; size 0.13 mum; substrate noise; system-on-a-chip; CMOS technology; Circuit noise; Coupling circuits; Crosstalk; Doping profiles; Frequency; Integrated circuit noise; MOSFETs; System-on-a-chip; Voltage-controlled oscillators;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
DOI :
10.1109/SMIC.2009.4770528
