DocumentCode :
2557870
Title :
Multiple doping of silicon-germanium alloys for thermoelectric applications
Author :
Fleurial, J.-P. ; Vining, Cronin B. ; Borshchevsky, Alex
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear :
1989
fDate :
6-11 Aug 1989
Firstpage :
701
Abstract :
It is shown that heavy doping of n-type Si/Ge alloys with phosphorus and arsenic (V-V doping interaction) by diffusion leads to a significant enhancement of their carrier concentration and possible improvement of the thermoelectric figure of merit. High carrier concentrations were achieved by arsenic doping alone, but for a same doping level higher carrier mobilities and lower resistivities are obtained through phosphorus doping. By combining the two dopants with the proper diffusion treatments, it was possible to optimize the different properties, obtaining high carrier concentration, good carrier mobility and low electrical resistivity. Similar experiments, using the III-V doping interaction, were conducted on boron-doped p-type samples and showed the possibility of overcompensating the samples by diffusing arsenic, in order to get n-type behavior
Keywords :
Ge-Si alloys; arsenic; carrier density; carrier mobility; phosphorus; semiconductor materials; thermoelectric conversion; SiGe:P,As alloys; V-V doping interaction; carrier concentration; carrier mobilities; diffusion; electrical resistivity; multiple doping; semiconductor; thermoelectric applications; thermoelectric figure of merit; Conductivity; Doping; Electric resistance; Germanium alloys; Germanium silicon alloys; III-V semiconductor materials; Lead; Silicon alloys; Silicon germanium; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Engineering Conference, 1989. IECEC-89., Proceedings of the 24th Intersociety
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IECEC.1989.74543
Filename :
74543
Link To Document :
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