• DocumentCode
    2557937
  • Title

    High Temperature DC and RF Behavior of Partially Depleted SOI versus Deep n-Well Protected Bulk MOSFETs

  • Author

    Emam, M. ; Vanhoenacker-Janvier, D. ; Raskin, J. -P

  • Author_Institution
    Microwave Lab., Univ. Catholique de Louvain, Louvain-la-Neuve
  • fYear
    2009
  • fDate
    19-21 Jan. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The introduction of deep n-well protection for bulk MOS transistors can highly enhance their DC and RF performance. It also gives the advantage of having floating-body and body-tied structures in bulk MOSFETs while eliminating the disadvantages related to the shift in performance between these two structures. We demonstrate that the high temperature, DC and RF performance of n-well isolated bulk MOSFETs are really competitive compared to the state-of-the-art Partially Depleted SOI MOS technology.
  • Keywords
    MOSFET; elemental semiconductors; microwave devices; silicon; silicon-on-insulator; DC performance; RF performance; Si; body-tied structures; bulk MOSFET; deep n-well protection; floating-body structures; partially depleted SOI; CMOS technology; Capacitance; Isolation technology; Leakage current; MOSFETs; Protection; Radio frequency; Silicon on insulator technology; Switches; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-3940-9
  • Electronic_ISBN
    978-1-4244-2831-1
  • Type

    conf

  • DOI
    10.1109/SMIC.2009.4770530
  • Filename
    4770530