Title :
Negative charging and secondary emission of Teflon FEP under electron irradiation
Author :
Berraissoul, A. ; Gross, B.
Author_Institution :
Inst. for Electroacoust., Tech. Univ. of Darmstadt, West Germany
Abstract :
One-side-metallized Teflon FEP films of 25-μm thickness were irradiated on the nonmetallized side with electron beams of energy above that of the second crossover point EII. E II is the energy at which the number of emitted secondary electrons equals the number of incident primaries. For a beam energy Eb=12 keV, the sample surfaces reaches a potential of Vs=10.5 kV, corresponding to EII =1.5 keV. Due to this charging, the effective energy of the incident electrons decreases. Measurements of the currents induced in the rear electrode allow this secondary-emission yield to be determined as a function of energy. Results are compared with data published by other authors and are represented by an approximate relation
Keywords :
polymer films; secondary electron emission; static electrification; surface potential; Teflon FEP; electron irradiation; films; negative charging; potential; secondary emission; Backscatter; Chemistry; Current measurement; Electrodes; Electron beams; Electron emission; Energy measurement; Physics; Surface charging; Voltage;
Conference_Titel :
Electrets, 1988. (ISE 6) Proceedings., 6th International Symposium on (IEEE Cat. No.88CH2593-2)
Conference_Location :
Oxford
DOI :
10.1109/ISE.1988.38581
