DocumentCode :
2558213
Title :
AM/PM Nonlinearities in SiGe HBTs
Author :
Horst, Stephen ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2009
fDate :
19-21 Jan. 2009
Firstpage :
1
Lastpage :
4
Abstract :
An analysis of AM/PM nonlinear distortion in advanced SiGe HBTs is presented. The results show that an optimum bias point exists in the high-injection collector current density regime as the device nears BVCEO. At this point, the phase deviation remains close to zero, even as the transistor gain goes into compression. This effect can be further optimized by matching the output of the device to its optimum OIP3 impedance. These results should prove useful for power amplifier design for high data rate electronic systems, which typically require high peak-to-average power ratios.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; intermodulation distortion; nonlinear distortion; AM/PM nonlinear distortion; HBT; SiGe; heterojunction bipolar transistors; high data rate electronic systems; high-injection collector current density regime; intermodulation distortion; optimum bias point; peak-to-average power ratio; power amplifier design; Degradation; Distortion measurement; Germanium silicon alloys; Linearity; Phase distortion; Phase measurement; Signal generators; Silicon germanium; Tuners; Wireless LAN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
Type :
conf
DOI :
10.1109/SMIC.2009.4770544
Filename :
4770544
Link To Document :
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