Title :
Investigation of capacitor voltage transformers
Author_Institution :
Div. of Appl. Phys., CSIRO, Lindfield, NSW, Australia
Abstract :
An investigation has been carried out on 330-kV and 132-kV CVTs (capacitor voltage transformers) with seven to ten years of service life. The population total was 148 with an extensive DGA (dissolved gas analysis) testing history. The failures and high DGA results could not be correlated with location operating conditions or associated equipment. Units removed from service for high gas production but standing deenergized for more than a few months showed low PD (partial discharge) activity. Laboratory measurements showed that all units increased in capacitance with voltage, time, and temperature. For normal units tan δ remained constant or slightly decreased for these same variables. Abnormal units showed increasing tan δ with temperature. Thermal runaway could be induced in these abnormal units at normal operating voltage and about 25°C above ambient temperature. Examination of failed capacitors showed puncture of the paper between the foils in the center of the pack. This same mode of failure could be reproduced in bench tests on individual capacitor packs. It was concluded that DGA testing is important and should be continued, that failed or suspect units should be tested within two weeks of removal from service, and that the failure mechanism in the CVTs investigated is thermal runaway due to increasing dielectric loss
Keywords :
chemical analysis; dielectric losses; failure analysis; loss angle; partial discharges; potential transformers; power capacitors; transformer testing; 132 kV; 330 kV; DGA testing; capacitor voltage transformers; dielectric loss; dissolved gas analysis; failed capacitors; failure mechanism; paper-oil dielectric; partial discharge; tan δ; thermal-runaway; Capacitors; Dielectric losses; Dissolved gas analysis; History; Laboratories; Partial discharges; Production; Temperature; Testing; Voltage transformers;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109780