• DocumentCode
    2558480
  • Title

    Study of effects of space charge in polyethylene by its direct probing

  • Author

    Suzuoki, Y. ; Furuta, T. ; Mizutani, T. ; Ieda, M. ; Yoshifuji, N.

  • Author_Institution
    Dept. of Electr. Eng., Nagoya Univ., Japan
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    401
  • Lastpage
    404
  • Abstract
    The laser-induced-pressure-pulse technique studies quantitatively the behavior of space charge in unoxidized and oxidized low-density polyethylene (PE) samples whose thicknesses ranged from 25 μm to 1 mm. The distribution of space charge changes with the applied field, temperature, extent of oxidation, and thickness of the samples. It was found that prominent negative space charge was formed near the cathode in oxidized PE, indicating that oxidation enhanced electron injection from the cathode. The amount of the negative charge increased with applied field, which suggests that the electron injection is enhanced by the applied field. The depth of the charge centroid from the cathode became larger with increasing temperature and applied field. This indicates that the effective mobility increases with temperature. The complicated behavior of the space charge suggests that space-charge formation is determined by electron injection from the cathode, transport, trapping, detrapping, and charge exchange at the anode
  • Keywords
    insulation testing; measurement by laser beam; organic insulating materials; polymers; space charge; 25 micron to 1 mm; LDPE; applied field; charge centroid; charge exchange; detrapping; direct probing; effective mobility; electron injection; laser-induced-pressure-pulse technique; negative charge; oxidation; polyethylene; space charge; trapping; Cable insulation; Cathodes; Electrons; Optical pulse generation; Optical pulses; Oxidation; Polyethylene; Space charge; Space vector pulse width modulation; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109783
  • Filename
    109783