DocumentCode
2558480
Title
Study of effects of space charge in polyethylene by its direct probing
Author
Suzuoki, Y. ; Furuta, T. ; Mizutani, T. ; Ieda, M. ; Yoshifuji, N.
Author_Institution
Dept. of Electr. Eng., Nagoya Univ., Japan
fYear
1990
fDate
3-6 Jun 1990
Firstpage
401
Lastpage
404
Abstract
The laser-induced-pressure-pulse technique studies quantitatively the behavior of space charge in unoxidized and oxidized low-density polyethylene (PE) samples whose thicknesses ranged from 25 μm to 1 mm. The distribution of space charge changes with the applied field, temperature, extent of oxidation, and thickness of the samples. It was found that prominent negative space charge was formed near the cathode in oxidized PE, indicating that oxidation enhanced electron injection from the cathode. The amount of the negative charge increased with applied field, which suggests that the electron injection is enhanced by the applied field. The depth of the charge centroid from the cathode became larger with increasing temperature and applied field. This indicates that the effective mobility increases with temperature. The complicated behavior of the space charge suggests that space-charge formation is determined by electron injection from the cathode, transport, trapping, detrapping, and charge exchange at the anode
Keywords
insulation testing; measurement by laser beam; organic insulating materials; polymers; space charge; 25 micron to 1 mm; LDPE; applied field; charge centroid; charge exchange; detrapping; direct probing; effective mobility; electron injection; laser-induced-pressure-pulse technique; negative charge; oxidation; polyethylene; space charge; trapping; Cable insulation; Cathodes; Electrons; Optical pulse generation; Optical pulses; Oxidation; Polyethylene; Space charge; Space vector pulse width modulation; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location
Toronto, Ont.
ISSN
1089-084X
Type
conf
DOI
10.1109/ELINSL.1990.109783
Filename
109783
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